Direct imaging of transient interference in a single-mode waveguide using near-field scanning optical microscopy Yuan, Guang Wei ; Stephens, Matthew D. ; Dandy, David S. ; Lear, Kevin L. "This work was supported by the National Institutes of Health (NIH) under Grant EB00726." Near-field scanning optical microscopy was used to image transient interference between the guided mode and a leaky mode induced in a single-mode waveguide due to a localized adlayer. The observed field response in the adlayer region as well as the period and decay length of the subsequent interference are in good agreement with beam propagation calculations. The transient interference impacts the element spacing in local evanescent array coupled sensors. Colorado State University. Libraries 2005 text ; image application/pdf ECEkll00020.pdf FACFECEN100370ARTI eng c2005 IEEE
Direct imaging of transient interference in a single-mode waveguide using near-field scanning optical microscopy
Yuan, Guang Wei ; Stephens, Matthew D. ; Dandy, David S. ; Lear, Kevin L.
"This work was supported by the National Institutes of Health (NIH) under Grant EB00726."
Near-field scanning optical microscopy was used to image transient interference between the guided mode and a leaky mode induced in a single-mode waveguide due to a localized adlayer. The observed field response in the adlayer region as well as the period and decay length of the subsequent interference are in good agreement with beam propagation calculations. The transient interference impacts the element spacing in local evanescent array coupled sensors.
Colorado State University. Libraries
2005
text ; image
application/pdf
ECEkll00020.pdf
FACFECEN100370ARTI
eng
c2005 IEEE