Fabrication and performance of selectively oxidized vertical-cavity lasers Choquette, Kent D. ; Lear, Kevin L. ; Schneider, Richard P. ; Geib, Kent M. ; Figiel, J. J. ; Hull, Robert, 1959- "The work at Sandia National Laboratories was supported in part by the United States DOE under contract No. DE-AC04-94AL85000." We report the high yield fabrication and reproducible performance of selectively oxidized vertical-cavity surface emitting lasers. We show that linear oxidation rates of AlGaAs without an induction period allows reproducible fabrication of buried oxide current apertures within monolithic distributed Bragg reflectors. The oxide layers do not induce obvious crystalline defects, and continuous wave operation in excess of 650 h has been obtained. The high yield fabrication enables relatively high laser performance over a wide wavelength span. We observe submilliamp threshold currents over a wavelength range of up to 75 nm, and power conversion efficiencies at 1 mW output power of greater than 20% over a 50-nm wavelength range. Colorado State University. Libraries 1995 text ; image application/pdf ECEkll00038.pdf FACFECEN100388ARTI eng c1995 IEEE
Fabrication and performance of selectively oxidized vertical-cavity lasers
Choquette, Kent D. ; Lear, Kevin L. ; Schneider, Richard P. ; Geib, Kent M. ; Figiel, J. J. ; Hull, Robert, 1959-
"The work at Sandia National Laboratories was supported in part by the United States DOE under contract No. DE-AC04-94AL85000."
We report the high yield fabrication and reproducible performance of selectively oxidized vertical-cavity surface emitting lasers. We show that linear oxidation rates of AlGaAs without an induction period allows reproducible fabrication of buried oxide current apertures within monolithic distributed Bragg reflectors. The oxide layers do not induce obvious crystalline defects, and continuous wave operation in excess of 650 h has been obtained. The high yield fabrication enables relatively high laser performance over a wide wavelength span. We observe submilliamp threshold currents over a wavelength range of up to 75 nm, and power conversion efficiencies at 1 mW output power of greater than 20% over a 50-nm wavelength range.
Colorado State University. Libraries
1995
text ; image
application/pdf
ECEkll00038.pdf
FACFECEN100388ARTI
eng
c1995 IEEE